Technical Session I
Flicker Detection with Optimized Continuous Point-On-Wave (CPOW) Monitoring and Data Visualization
Traditional power quality (PQ) monitors record waveform data only when preset threshold limits are exceeded, capturing short-term recordings based on significant changes. While this approach improves efficiency in data storage and analysis, it poses challenges: improperly set thresholds may either overlook anomalies or generate excessive data, complicating a PQ investigation. Continuous Point-On-Wave (CPOW) monitoring offers a comprehensive solution by capturing every waveform cycle, ensuring no critical event is missed. The challenge lies in efficiently managing and extracting meaningful insights from the vast volume of data—over five million 60Hz cycles per day. This presentation introduces a streamlined method, supported by a real-world PQ investigation, demonstrating how CPOW successfully detected and analyzed waveform anomalies that conventional PQ monitors failed to capture.
Limitations of Flicker as an RMS voltage variation phenomenon
Flicker has traditionally been defined and evaluated as an RMS voltage variation phenomenon, a framework rooted in the pre–solid-state lighting era and tied to the thermal and visual response of incandescent filaments to voltage fluctuations. However, with the widespread adoption of LED technology, the mechanisms driving perceived flicker have expanded beyond RMS variations to include point-on-wave effects and harmonic distortion. This presentation examines a real-world field investigation into reports of “flickering” LED lights, where distortion and point-on-wave behavior were identified as key contributors. Despite measured Pst and Plt values falling within current IEEE guidelines, the investigation highlights the limitations of existing flicker metrics and underscores the need for updated methodologies to accurately assess flicker in modern solid-state lighting applications.